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Getting Started

  • Introduction to EMOS
    • What is EMOS?
    • Key Concepts
      • Information Units
      • Features
    • System Architecture
    • Core Workflow
    • Benefits
  • System Overview
    • Architecture Overview
    • Information Units Layer
      • Databases
      • Generators
      • Predictors
    • Features Layer
      • Materials Exploration Features
      • Electronics Application Features
    • Data Flow
      • Typical Workflow Pattern
      • Modular Design Benefits
    • Integration Patterns
      • Factory Pattern
      • Template Method Pattern
  • Quick Start Guide
    • Basic Workflow
      • Step 1: Choose Your Research Goal
      • Step 2: Select a Feature
      • Step 3: Configure Information Units
      • Step 4: Provide Inputs
    • Example Workflows
      • Example 1: Finding High-Conductivity Materials
      • Example 2: Interface Analysis
      • Example 3: New Material Generation
    • Common Input Parameters
      • Universal Parameters
      • Feature-Specific Parameters
    • Understanding Results
      • Result Structure
      • Interpreting Outputs
    • Best Practices
      • Information Unit Selection
      • Input Guidelines
      • Result Analysis
    • Troubleshooting
      • Common Issues

Information Units

  • Information Units
    • Overview
    • Design Principles
      • Standardized Interface
      • Factory Pattern
      • Consistent Usage Pattern
    • Adding New Information Units
  • Databases
    • Available Databases
      • ICSD - Inorganic Crystal Structure Database
      • COD - Crystallography Open Database
      • OQMD - Open Quantum Materials Database
      • AFLOWLIB - Automatic-FLOW Database
      • MP - Materials Project Database
      • Alexandria - Materials Database
      • NOMAD - Novel Materials Discovery Repository
      • JARVIS - Joint Automated Repository for Various Integrated Simulations
    • Usage Patterns
      • Basic Database Query
      • Multiple Database Integration
      • Error Handling
    • Best Practices
      • Database Selection
      • Query Optimization
      • Data Validation
  • Generators
    • Available Generators
      • MatterGen - Microsoft’s Crystal Structure Generator
      • GNoME - Graph Networks for Materials Exploration
      • iMatGen - Inverse Materials Generator
      • MatGAN - Materials Generative Adversarial Network
      • MolGAN - Molecular Generative Adversarial Network
      • CondDFCVAE - Conditional Deep Feature Consistent VAE
      • MyGen1 - Custom Generator 1
      • MyGen2 - Custom Generator 2
    • Usage Patterns
      • Basic Material Generation
      • Property-Targeted Generation
      • Multi-Generator Workflow
    • Best Practices
      • Generator Selection
      • Input Design
      • Output Processing
      • Integration Tips
  • Predictors
    • Available Predictors
      • MatterSim - Materials Simulation Predictor
      • M3GNet - Materials 3D Graph Network
      • PFP - Property Fingerprint Predictor
      • DeepMD - Deep Molecular Dynamics
      • SynthNN - Synthesis Neural Network
      • eSEN - Electronic Structure Estimation Network
      • MyPred1 - Custom Predictor 1
      • MyPred2 - Custom Predictor 2
    • Usage Patterns
      • Basic Property Prediction
      • Multi-Predictor Validation
      • Property Screening Workflow
    • Best Practices
      • Predictor Selection
      • Input Preparation
      • Result Interpretation
      • Performance Optimization

Features

  • Features
    • Feature Architecture
      • Base Feature Interface
      • Template Method Pattern
      • Information Unit Integration
    • Adding New Features
  • Materials Exploration Features
    • Available Features
      • 1. Material Search (ID: 1)
      • 2. Material Generation (ID: 2)
      • 3. Database Extractor (ID: 3)
      • 4. Material Characterization (ID: 4)
      • 5. DFT Calculation (ID: 5)
      • 6. Crystallographic Analysis (ID: 6)
      • 7. Quantum Mechanics (ID: 7)
      • 8. Tensor Analysis (ID: 8)
    • Common Workflow Patterns
      • Multi-Feature Material Discovery
      • Comprehensive Material Analysis
    • Best Practices
      • Feature Selection
      • Input Guidelines
      • Result Interpretation
  • Electronics Application Features
    • Available Features
      • 9. Device Synthesizability (ID: 9)
      • 10. Interface Calculation (ID: 10)
      • 11. Property Prediction (ID: 11)
      • 12. Band Structure (ID: 12)
      • 13. Thermal Management (ID: 13)
      • 14. Reliability Assessment (ID: 14)
      • 15. Process Integration (ID: 15)
      • 16. Advanced Characterization (ID: 16)
    • Common Workflow Patterns
      • Device Development Workflow
      • Performance Optimization Workflow
    • Application-Specific Guidelines
      • Semiconductor Devices
      • Power Electronics
      • RF/Microwave Devices
      • Photonic Devices
    • Best Practices
      • Feature Selection
      • Input Guidelines
      • Result Interpretation
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